New energy testing systems can also be used in semiconductor testing.
1. Temperature shock and temperature cycle testing of the chip.
2. High and low temperature cycle testing of chips, fatigue failure testing.
3. Performance testing of chips, modules, integrated circuits, electronic components, etc.
4. Verification of design.
5. Failure analysis.
6. Reliability analysis.
7. Temperature control for chip packaging.
8. Test and analyze the temperature resistance and failure of electronic components.
