> 소식 > 제품 뉴스 > Temperature control test of semiconductor.

Temperature control test of semiconductor.

02 15. 2023

Heater chiller test equipment is applied to the adaptive temperature test of semiconductors and chips in the range of -120℃ ~ 200℃.

Temperature control test of semiconductor.

Semiconductor heater chiller is used for high and low temperature impact test and failure test at different temperatures in integrated circuits, chips, semiconductors, PCBs and other applications. In addition to semiconductor dynamic temperature controller, it can also be called heat flow meter.


Test the storage and use of semiconductors under extreme temperature and pressure, and judge whether the performance of the equipment meets the use requirements after the test.